This article discusses a virtual workshop organized by the Environmental Transmission Electron Microscopy (ETEM) Team at the National Institute of Standards and Technology (NIST). The workshop focuses on the latest developments in in-situ electron microscopy, which allows scientists to observe and measure nanoscale processes in electronic and quantum materials under real working conditions. These experiments provide valuable insights into the structure, chemistry, and functionality of materials at high spatial resolution, using various stimuli like heat, light, and different environments.
The event features presentations from leading researchers in the field, covering topics such as phase transitions in materials, imaging techniques, and the use of machine learning in electron microscopy. The workshop also includes open discussion panels to address current challenges and opportunities in the field. It honors Dr. Renu Sharma, a pioneer in in-situ electron microscopy, and aims to highlight the future of this technology in studying electronic and quantum materials. The workshop is free to attend, with registration closing on July 9, 2020.
Keywords: Enabling Technologies and Quantum Devices, Quantum Sensing and Metrology, In Situ Transmission Electron Microscopy
