NIST is developing advanced 3D nanometer-scale dimensional measurement methods, reference artifacts, and protocols to support nanotechnology research and applications. Their work focuses on understanding and simulating interactions between electrons, light, and mechanical probes with nanoscale structures, devices, and nanoparticles.
Key points:
– NIST is extending length measurement science to nanotechnology as part of its mission
– They develop measurement methods, reference artifacts, and software for nanotechnology applications
– Their work supports industries like nanotechnology, photonics, and biomedical research
– Measurement accuracy is critical for nanoscale devices and structures
– NIST’s publications are heavily referenced and influence industry metrology tools
The potential impact of NIST’s work is significant, as it will enable more accurate measurement and characterization of nanoscale devices and structures, which is crucial for advancing nanotechnology applications across various industries.
Source: https://www.nist.gov/programs-projects/three-dimensional-nanometer-metrology
Keywords: dimensional metrology, nanotechnology, measurement methods, reference artifacts
