Sources, detectors and metrology | NIST

NIST researchers are developing advanced techniques for characterizing single-photon detectors and sources, which are crucial for quantum technologies. Key points:

1. Detector Characterization: NIST is developing methods to accurately measure and characterize single-photon detector parameters, including efficiency, noise, and recovery times. They have achieved world-record calibration uncertainties for single-photon avalanche diodes.

2. Detector Technologies: NIST is researching various single-photon detector technologies, including avalanche photodiodes, cryogenic microbolometers, and multiplexed detectors. They are also developing bias gating techniques to improve high-count-rate performance.

3. Source Characterization: NIST is developing new sources of single photons and entangled light, particularly waveguide-based spontaneous parametric down-conversion sources. They are also working on methods to characterize complex multimode sources.

4. Statistical Methods: NIST is using statistical methods to analyze light source statistics and detector performance without direct physical examination of the sources or detectors.

5. Impact on Quantum Technologies: Accurate characterization of detectors and sources is essential for advancing quantum information, metrology, biology, and remote sensing applications. NIST’s work aims to improve uncertainty levels in quantum measurements and enable practical quantum information processing.

Implementation timeframes are not specified, but the research is ongoing at NIST laboratories.

Source: https://www.nist.gov/programs-projects/sources-detectors-and-metrology

Keywords: photon, source, detector, efficiency, entanglement

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