Enriched Silicon and Devices for Quantum Information | NIST
NIST researchers have developed a novel method for growing ultra-enriched 28Si epilayers on natural abundance silicon substrates, enabling the…
Optical Polarization Metrology | NIST
Title: NIST Develops Advanced Optical Polarization Metrology Techniques NIST researchers are developing new methods for measuring and…
Optical scattering from surfaces | NIST
NIST Researches Optical Scattering from Surfaces The National Institute of Standards and Technology (NIST) is conducting research on optical…
Fundamental Physics: Electric Field Imaging with Neutrons | NIST
Researchers at NIST and Sandia National Laboratories have successfully imaged an isolated electric field using neutrons for the first time.…
Precision Materials for Quantum Devices | NIST
Researchers at NIST have developed advanced fabrication techniques for quantum devices using ultra-high vacuum (UHV) systems. Key findings…
Fundamental Physics: Measurement of the Neutron Magnetic Dipole Moment Using Schwinger Scattering | NIST
Researchers at NIST have successfully measured the neutron magnetic dipole moment using a new technique called Schwinger scattering. This…
Applied: Continuous Spin-Exchange Optical Pumping in High Flux Neutron Beams | NIST
Researchers from NIST and the Institut Laue Langevin (ILL) collaborated on experiments to study the effects of high flux neutron beams on…
Applied: Pushing and Understanding the Limits of Spin-Exchange Optical Pumping of 3He | NIST
Researchers at NIST have developed a new method for polarizing helium-3 gas using spin-exchange optical pumping, achieving a record 88%…