The Metrology of the Ohm Project at NIST focuses on developing and maintaining resistance and current measurement standards. Key points:
1. The project provides resistance standards traceable to NIST, covering a wide range of current levels from 3000 A to 20 fA. These standards support various measurements including impedance, temperature, strain, and power.
2. NIST has maintained close working relationships with other leading national metrology institutes, successfully completing bilateral and key comparisons. This collaboration has led to advancements in cryogenic current comparators (CCCs) and improved resistance standards.
3. The project’s resistance calibration service brings in significant revenue to NIST while supporting over a dozen other calibration areas. Project staff provide extensive customer consultation on topics including low current measurements, ac impedance, and active participation in quantum metrology research.
4. Recent publications highlight advancements in graphene quantum Hall resistance arrays, comparisons between graphene and GaAs quantized Hall devices, and an advanced temperature-control chamber for resistance standards.
The Metrology of the Ohm Project plays a crucial role in providing internationally consistent resistance standards that support the scientific and industrial foundations of the U.S. economy, enabling cost-effective electrical measurements and improved product performance.
Source: https://www.nist.gov/programs-projects/metrology-ohm
Keywords: Graphene, Resistance, Metrology, Hall, SQUID
