The article discusses NIST’s ongoing research project focused on advancing the metrology of microwave thermal noise and its applications in spectrum sensing and assessment. This project has been a long-standing research area at NIST, with early contributions to standardizing guided-wave noise measurements in microwave systems. However, the rapid advancement of basic applications and hardware capabilities has outpaced progress in noise metrology, creating opportunities for new research with significant impact.
NIST’s current capabilities in this area include theory and practice of guided-wave, radiated, and cryogenic noise at various frequencies from 30 MHz to 110 GHz. The research efforts are focused on extending this metrology into the system’s domain, relating physical conditions to other spectrum activity, impacts on users, and behavior in practical environments. The article highlights several publications that demonstrate NIST’s ongoing efforts to advance the field of noise metrology and its applications in spectrum sensing and assessment.
Source: https://www.nist.gov/programs-projects/spectrum-sensing-and-noise
Keywords: metrology, sensing, microwave, noise, spectroscopy
