NIST and Brookhaven National Laboratory (BNL) are collaborating to develop advanced X-ray absorbance spectroscopy techniques at the National Synchrotron Light Source II facility in Upton, NY. The project aims to create highly sensitive and fast detector technologies for measuring the chemical, electronic, and physical properties of advanced materials.
The synchrotron source provides several key advantages over traditional lab-based systems, including highly focused beams for measuring non-uniform samples, tunable energy for depth-dependent measurements, and microcalorimeter detectors with 1 eV resolution. These capabilities are being used to characterize semiconductor devices, combinatorial material arrays, and process uniformity.
The collaboration has developed several key spectrometers, including XAFS, HAXPES, μCAL, and NEXAFS, which are being used across various NIST projects and programs. The project is expected to have significant impact on the development and characterization of advanced materials and devices.
Source: https://www.nist.gov/programs-projects/synchrotron-x-ray-absorbance-spectroscopy
Keywords: X-ray, Spectroscopy, Quantum Sensors
