NIST is developing Standard Reference Materials (SRMs) and measurement methods for characterizing structures at the scale of X-ray wavelengths. These SRMs will help in the development of new crystalline materials and devices with applications in various fields.
The project focuses on five main areas:
1. Line Position: Calibrating the angle 2θ
2. Line Profile: Analyzing microstructure
3. Instrument Response: Calibrating angle and intensity
4. Quantitative Analysis: Measuring phase abundance
5. Thin Film SRMs: Measuring thickness, surface roughness, and density of layered structures
NIST’s most common use of SRMs is for calibrating diffraction line position, which requires lattice parameter certification traceable to the International System of Units (SI) meter. The project utilizes facilities like the Divergent Beam Diffractometer (DBD) and the Parallel Beam Diffractometer (PBD) for traceable measurement capabilities in thin films and powders.
Source: https://www.nist.gov/programs-projects/diffraction-metrology-and-standards
Keywords: NIST Diffraction Metrology, Standard Reference Materials (SRMs), Structural characterization
