Title: NIST Develops High-Throughput Screening Tool for Thermoelectric Materials
Summary:
The National Institute of Standards and Technology (NIST) has developed a high-throughput screening tool for characterizing thin film thermoelectrics across a range of temperatures. The tool uses a “hot probe” technique to measure the Seebeck coefficient and electrical resistivity of materials in a combinatorial library format.
Key features of the screening tool:
1. Temperature range: 300 K to 800 K
2. “Hot probe” technique with independently spring-loaded thermocouple probes
3. Quasi-steady state differential method for Seebeck coefficient measurement
4. 4-point probe technique for sheet resistance measurement
5. Correction for probe asymmetry and Seebeck contributions to resistive voltage
The tool enables rapid evaluation of thermoelectric properties for large numbers of materials, accelerating the development of new thermoelectric materials for energy conversion applications.
Keywords: High-throughput, Combinatorial, Thermoelectric
