What is Force | NIST
The article explains the concept of force and its measurement. Force is defined as the push or pull exerted on an object, which can cause…
Current and Future EBIT Research | NIST
This article discusses the use of an Electron Beam Ion Trap (EBIT) for precise measurements of atomic and ionic properties. The EBIT allows…
Index of Semiconductor Process Gases – Helium | NIST
This article presents a comprehensive table of thermophysical properties for helium-4 gas at various temperatures, including reduced heat…
Time and Frequency from A to Z, Q to Ra | NIST
The article discusses various aspects of time and frequency measurement, focusing on the quality factor (Q) and its importance in determining…
NIST TN 1297: Appendix A. Law of Propagation of Uncertainty | NIST
Here is a summary of the NIST TN 1297: Appendix A. Law of Propagation of Uncertainty document: The document provides a comprehensive treatment…
Time and Frequency from A to Z, Ch to Cy | NIST
NIST has published a comprehensive guide covering various aspects of timekeeping and frequency measurement standards. The document defines key…
Electron Beam Ion Trap (EBIT) | NIST
The National Institute of Standards and Technology (NIST) has developed an advanced research tool called the Electron Beam Ion Trap (EBIT).…
Electron-Ion Collisions | NIST
This article discusses research conducted at NIST using an Electron Beam Ion Trap (EBIT) to study highly charged ions and their interactions.…
Atomic Reference Data for Electronic Structure Calculations, Electronic Configurations of the Elements | NIST
The article discusses the electronic configurations of neutral elements and their first cations from hydrogen to uranium. The data is sourced…