Title: NIST Webinar on CHIPS Metrology Program and Semiconductor Research
The National Institute of Standards and Technology (NIST) is hosting a webinar focused on their CHIPS Metrology Program, which aims to advance metrology research critical for next-generation microelectronics. The program develops precise measurement techniques for microelectronic materials and systems, addressing industry challenges and improving standards and practices in semiconductor manufacturing.
During the webinar, Marla Dowell, director of the CHIPS Metrology Program, will discuss how the program supports the CHIPS for America initiative. The event will also feature select NIST researchers and their groundbreaking CHIPS Metrology projects. Attendees will have the opportunity to engage in interactive discussions, ask questions, and explore the latest advancements in metrology that are shaping the future of microelectronics.
Source: https://www.nist.gov/news-events/events/inside-chips-metrology-research-accelerates-innovation
Keywords: Metrology, Microelectronics, Semiconductors, Measurements, Standards
