Title: NIST Develops Advanced Phase Shift Detector for Improved Sensitivity in Measurements
Summary:
The National Institute of Standards and Technology (NIST) has developed a new phase shift detector that significantly enhances the sensitivity of various measurement techniques. The detector utilizes a highly balanced microwave bridge and an optimized microwave probe to detect extremely small phase shifts caused by changes in the effective dielectric constant of a sample.
Key points:
– The detector can greatly increase the sensitivity of Fourier transform infrared spectroscopy (FTIR) and thermometry measurements
– Non-contact measurement allows for scanned probe measurements with high sensitivity
– Probes can be fabricated using standard silicon processing technology, enabling low-cost disposable probes
– The detector’s strength lies in its ability to detect minute changes in microwave phase shift, which is directly proportional to sample temperature change
The development of this advanced phase shift detector has the potential to significantly improve the sensitivity and utility of a wide range of conventional measurement techniques, making it a valuable tool in various scientific and industrial applications.
Source: https://www.nist.gov/patents/phase-shift-detector-process-making-and-use-same
Keywords: Detector, Sensitivity, Phase Shift, Microwave, Metrology
