The Electron Beam Ion Trap (EBIT) is a device used to study highly charged ions by removing electrons from atoms using an electron beam. The primary components include an electron gun, magnetic coils, and high-voltage electrodes. The electron beam is decelerated and focused to create highly charged ions, which can then be studied spectroscopically.
The first EBIT prototype was developed by Morton Levine and Ross Marrs, with the goal of improving upon earlier devices like the EBIS. Since its launch, EBIT has been successful in producing very high charge states, leading to various applications. A high-energy version called Super EBIT has been developed, capable of producing fully stripped uranium, the highest atomic number element.
NIST, NRL, and Oxford University have collaborated to build EBITs for high-precision spectroscopy of highly charged ions. The assembly of these machines progressed in parallel, with the NIST EBIT becoming operational in August 1993. Similar devices called EBIS are also used for producing highly charged ion beams, with facilities located worldwide.
Keywords: ions, electron, spectroscopy, ions, charged
