Dr. James K. Olthoff has been appointed as the first Chief Metrologist at the National Institute of Standards and Technology (NIST). In this role, he will represent NIST’s measurement capabilities both nationally and internationally. Prior to this appointment, Olthoff served as the Associate Director for Laboratory Programs and the Director of NIST’s Physical Measurement Laboratory, overseeing the institute’s quantum computing, neuromorphic computing, and quantum measurement standards programs.
Olthoff has extensive experience in metrology, having joined NIST in 1987 and holding various leadership positions throughout his career. He has represented NIST in international metrology organizations and has won numerous awards for his contributions to the field. In his new role as Chief Metrologist, Olthoff will work to ensure that NIST’s measurement capabilities remain at the forefront of global standards.
Source: https://www.nist.gov/people/james-k-olthoff
Keywords: metrology, measurement, standards, quantum
