Title: NIST Launches METIS Data Exchange Ecosystem for Semiconductor Manufacturing
NIST has introduced the METIS (Metrology Exchange to Innovate in Semiconductors) data exchange ecosystem to support stakeholders in the semiconductor manufacturing industry. Named after the Greek goddess of innovative ideas, METIS aims to provide access to research results from NIST’s CHIPS Metrology Program, which focuses on advancing U.S. semiconductor manufacturing capabilities.
The METIS beta release currently contains features and tools specific to three of the over 40 CHIPS Metrology projects. Once fully deployed, research and data from all projects will be made available through the ecosystem. NIST is actively monitoring user feedback and addressing any issues that arise, with cybersecurity controls and audits required for each release.
METIS benefits a wide range of stakeholders, including microelectronics suppliers, manufacturers, product developers, and systems engineers in both academia and industry. Potential use cases for the ecosystem include general research and development data. However, at the outset, METIS will only include data from the CHIPS Metrology program. NIST is currently reviewing data management platforms and the development of product definitions, types, and characteristics for documentation and integration into METIS. The ecosystem itself does not offer funding opportunities.
Source: https://www.nist.gov/metis/frequently-asked-questions
Keywords: Metrology, CHIPS, semiconductor manufacturing
