The Metrology Exchange to Innovate in Semiconductors (METIS) is a new initiative by CHIPS for America to share advanced semiconductor measurement tools and data with stakeholders. A beta version was released in September 2024, with plans to expand and share data from all CHIPS Metrology projects.
The METIS data exchange ecosystem, developed by NIST, aims to facilitate the transfer of leading microelectronics research from labs to the commercial market. Key stakeholders include semiconductor manufacturers, suppliers, and researchers in academia and industry. The project goals include protecting intellectual property, aligning with NIST’s access to research results, safeguarding U.S. security interests, and ensuring the platform’s self-sustainability to meet future needs.
The public comment period for the METIS publication ran from December 2023 to February 2024, with the goal of gathering diverse perspectives to shape the final vision for the data-sharing platform.
Source: https://www.nist.gov/programs-projects/metis
Keywords: Metrology, Semiconductors, Data exchange
