Dr. David J. Gundlach is the Chief of the Nanoscale Device Characterization Division at NIST, focusing on developing measurement and characterization techniques for nanoscale materials and devices. With a background in physics and electrical engineering, Gundlach has held research positions at IBM and ETH Zurich before joining NIST in 2005. He has authored over 90 peer-reviewed articles and holds 5 patents. Gundlach’s current role involves leading a division that develops standards and measurement techniques for nanoscale devices, with a focus on future quantum technologies.
Source: https://www.nist.gov/people/david-gundlach
Keywords: Scalable, Nano-, Quantum, Solid-state, Information
