NIST Program Aims to Revolutionize Microelectronics with Ultrafast Spectroscopy
The National Institute of Standards and Technology (NIST) has launched a groundbreaking program focused on developing advanced spectroscopic techniques to provide trusted reference data for material properties critical to next-generation microelectronics and integrated optics.
Key aspects of the program include:
– Utilizing staff expertise in time-resolved spectroscopy, nonlinear optics, and time domain THz spectroscopy to provide trusted spectroscopic data on material properties relevant to microelectronics
– Producing trusted spectroscopic reference data on material properties such as conductivity, dielectric permittivity, and thermal conductivity
– Developing novel techniques for measuring these properties more precisely and with sufficient spatial resolution to allow measurements on heterogeneous devices
– Utilizing advanced ultrafast spectroscopic techniques for metrology, including optical pump, THz probe spectroscopy, phase-sensitive pump-probe spectroscopy, and optical two-dimensional coherent spectroscopy
The program aims to provide a foundation for improved microelectronics as defined by the OSTP National Strategy on Microelectronics Research, including analog and digital electronics, power electronics, optics and photonics, and micromechanics for memory, processing, sensing, and communications. It also aims to offer a trusted source of spectroscopic data relevant to high frequency electronics beyond 5G and establish standard measurements and best practices for accurately measuring difficult-to-measure properties like conductivity spectra in the THz range, mobility, and electro-optic/nonlinear optical coefficients.
These successful outcomes will have a significant impact on industry by serving as standard measurements and demonstrating best practices.
Source: https://www.nist.gov/programs-projects/ultrafast-spectroscopy-advance-microelectronics
Keywords: Quantum Sensing, Quantum Metrology, Quantum Devices
