The Applied Physics Division at NIST focuses on developing advanced measurement techniques for characterizing nanoscale structures. These techniques include scanning microwave microscopy, atom probe tomography, transmission electron microscopy, Raman spectroscopy, and time-resolved photoluminescence. The goal is to establish absolute uncertainties and systematic error measurements through cross-method comparisons and calibration techniques. The synthesized semiconductor nanostructures serve as test structures for validating these measurement methods and as building blocks for novel metrology tools and semiconductor devices.
Source: https://www.nist.gov/pml/applied-physics-division/quantitative-nanostructure-characterization
Keywords: semiconductor, nanostructures, metrology, uncertainties, semiconductor nanostructures
