NIST is developing advanced nanoscale spectroscopic metrology to measure critical properties of next-generation electronic and quantum materials and devices. This new technology will enable precise measurement of thermal, optical, compositional, and electrical properties at the nanoscale, which is essential for advancing semiconductor technologies and emerging fields like quantum computing, artificial intelligence, and 6G wireless communications.
The project brings together experts from NIST and various universities and research institutions to develop novel, non-destructive spectroscopic techniques with unprecedented spatial resolution and sensitivity. These capabilities will be crucial for understanding and optimizing the performance of new materials such as 2D semiconductors, quantum materials, and wide bandgap semiconductors.
The ultimate goal is to accelerate the development of advanced electronics and quantum devices by providing the necessary metrology tools to characterize and engineer materials at the nanoscale. This research has the potential to lead to breakthroughs in energy storage, quantum computing, and other cutting-edge technologies.
Keywords: Metrology, Nanoscale, Quantum, Spectroscopic, Materials
