Sungmin Kim is a researcher at NIST working on advanced scanning probe microscopy techniques for studying 2D quantum materials. With a background in physics and expertise in scanning probe microscopy and cryogenic systems, Kim has developed a state-of-the-art multifunctional quantum measurement system at NIST. This system combines atomic force microscopy (AFM), scanning tunneling microscopy (STM), and electron transport measurement capabilities, achieving the finest energy resolution to date. Kim’s work focuses on studying edge states in quantum Hall systems, graphene, and quantum anomalous Hall (QAHE) systems using these advanced microscopy techniques.
Source: https://www.nist.gov/people/sungmin-kim
Keywords: Quantum materials, Scanning probe microscopy, Atomic force microscopy, Scanning tunneling microscopy, Quantum measurement systems
