The National Institute of Standards and Technology (NIST) is leading a project to develop advanced characterization techniques for electronic materials, with a focus on 2D materials. The project aims to provide manufacturers with the tools needed to predict material failures and accurately analyze device lifetimes.
Key aspects of the project include:
– Utilizing electrical, thermal, and mechanical stress testing
– Developing core competencies applicable to various electronic materials
– Integrating advanced characterization techniques and reliability testing
– Using NIST’s state-of-the-art characterization capabilities
The project is expected to improve the fundamental understanding of electronic materials and accelerate the development of highly reliable materials and devices. NIST is offering National Research Council Post-Doctoral Research Opportunities focused on nanometer-scale characterization and reliability studies of 2D materials.
Source: https://www.nist.gov/programs-projects/electronic-material-characterization
Keywords: Characterization, Reliability testing, 2D materials
