Researchers have developed a new method to detect nanoscale defects in magnetic materials using spin waves—oscillating magnetic disturbances—trapped beneath a microscale cantilever. This technique allows scientists to non-destructively examine magnetic structures, such as those found in hard drives, and identify defects that could lead to memory failures. The method works by using microwaves to create spin waves in a thin magnetic film, which are then trapped under a magnetic probe tip. Defects in the material disturb these spin waves, revealing their presence and location with high precision.
This new approach improves on previous methods by aligning magnetic spins in-plane rather than perpendicular to the film surface, allowing for better resolution and more accurate representation of real-world magnetic devices. The technique was developed by a team from NIST, the University of Maryland, and the Royal Institute of Technology in Sweden. It offers a powerful tool for improving the reliability and performance of magnetic memory technologies, which are essential for future computing systems.
Keywords: spin waves, magnetic defects, non-destructive measurement
