NIST’s Center for Nanoscale Science and Technology (CNST) has developed advanced calibration methods for on-chip electrical measurements, which are crucial for characterizing and verifying the performance of semiconductor devices. These methods, developed over three decades, enable precise measurements of integrated components like transistors, capacitors, and interconnects, as well as the materials they are made from. The techniques have been used by manufacturers and technology accelerators such as DARPA for verifying advanced microelectronics devices.
The calibration methods developed by CNST are particularly important for high-frequency applications, such as 5G/6G communications, biomedicine, and space communications. Collaborations with major companies like Northrop Grumman, Teledyne, Raytheon, IBM, and Intel, as well as academic institutions and research labs, have contributed to the development of these calibration techniques. The methods are essential for verifying the performance of leading-edge integrated microelectronic components and interconnects at millimeter wave frequencies, as well as advanced materials.
Keywords: quantum devices, electrical measurements, microelectronics
