Researchers at the NIST Center for Nanoscale Science and Technology have created new optomechanical sensors for atomic force microscopy (AFM) that greatly expand the range of mechanical properties that can be studied. These sensors are built on a chip and use light to detect the movement of a tiny probe, which allows for more sensitive and versatile measurements compared to traditional bulky optical systems. This new design can adjust the stiffness of the probe over a wide range, from very soft to very stiff, without losing sensitivity or speed.
The new sensors can be up to 1,000 times stiffer or 10 times softer than previous designs, making them suitable for a wider range of materials and applications. They also respond much faster than current commercial AFM cantilevers, which could improve imaging and measurement accuracy. The next step is to integrate this technology into commercial AFM systems, which could lead to better tools for studying everything from soft biological materials to hard surfaces.
Keywords: displacement sensitivity, spring constant, cavity optomechanical
