Researchers at NIST have developed a new technique using focused lithium-ion beams to non-invasively measure and map the vibration patterns of trapped light within microscale optical resonators. This allows for more accurate measurements and the ability to fine-tune the resonators’ frequency by altering their shape.
The technique could revolutionize the manufacturing of optical sensors by enabling the creation of identical resonators, which is currently impossible. This would be crucial for applications in quantum information processing and single-photon detection.
The focused ion beam technique offers a non-invasive way to study the near-fields of these resonators, which are essential for their sensitivity to environmental changes. By mapping these vibration patterns, scientists can make the resonators even more sensitive to detect biomolecules and single atoms.
The new method provides a way to measure and modify the resonant properties of these tiny structures with unprecedented precision, opening up new possibilities for research in both nanophotonics and materials science.
Source: https://www.nist.gov/news-events/news/2015/12/ringing-new-way-measure-and-modulate-trapped-light
Keywords: Resonance, Lithium, Ion, Frequency, Imaging
