NIST researchers have developed a novel three-in-one instrument that can simultaneously perform atomic force microscopy (AFM), scanning tunneling microscopy (STM), and magnetic transport measurements. This “Swiss Army knife” for atom-scale measurements can help researchers better understand quantum materials, which are crucial for developing next-generation quantum computers and communication devices.
The instrument combines the capabilities of an AFM, STM, and magnetic transport setup into a single, compact device with fewer moving parts. By integrating these three measurement techniques, researchers can gain a more comprehensive understanding of quantum materials and their properties, such as resistance-less current flow, quantum jumps in electrical resistance, and new methods for designing quantum bits.
The three-in-one instrument is mounted inside a cryostat that chills the system to one-hundredth of a degree above absolute zero, minimizing quantum particle jitter and making large-scale quantum effects more pronounced and easier to measure. The device is also five to 10 times more sensitive than previous similar instruments, approaching the fundamental quantum noise limit.
This innovative instrument could revolutionize the study of quantum materials and accelerate the development of quantum technologies, such as quantum computers and communication devices.
Keywords: Quantum Materials, Atomic-Scale Measurements, Scanning Tunneling Microscope (STM), Atomic Force Microscope (AFM), Magnetic Transport
