NIST researchers have developed a method to accurately center quantum dots within photonic chips using optical microscopes, with an error margin of 10-20 nanometers. This precise alignment is crucial for chip-scale devices that use quantum dot radiation to store and transmit quantum information. The new method, which involves creating traceable standards and calibrations, could enable a hundred-fold increase in the number of high-performance devices. The research team, including members from the Joint Quantum Institute, created standards and calibrations traceable to the International System of Units (SI) for optical microscopes used to guide the alignment of quantum dots. The method identifies and corrects errors that were previously overlooked, such as shrinkage of semiconductor materials at ultracold temperatures and inaccuracies in the fabrication process. The researchers’ work could improve accuracy and reliability in other demanding applications of optical microscopy, such as imaging brain cells and mapping neural connections.
Keywords: Optical, Quantum, Photonic, Microscopy, Calibration, Traceable, Standards
