James K. Olthoff, a distinguished physicist with over 35 years of experience at NIST, has been appointed as the organization’s first chief metrologist. In this role, Olthoff will represent NIST’s measurement capabilities on a national and international level, working closely with NIST leadership to maintain the institute’s position as a global leader in metrology.
Olthoff’s extensive background at NIST includes serving as the associate director for laboratory programs and acting NIST director. He holds a Ph.D. in physics from the University of Maryland and completed postdoctoral research at The Johns Hopkins School of Medicine before joining NIST in 1984.
Source: https://www.nist.gov/blogs/taking-measure/authors/james-k-olthoff
Keywords: metrology, measurement, quantum
