The National Institute of Standards and Technology (NIST) is conducting research to better understand the role of atomic-scale defects in electronic devices. This knowledge is crucial for advancing emerging technologies and their associated measurement standards.
The project uses electron spin resonance (ESR) and electrically detected magnetic resonance (EDMR) techniques to study defects in electronic materials and devices. These methods allow researchers to examine both bulk samples and individual device structures at the atomic level.
NIST is collaborating with several universities and technology companies to advance this research. The project has already made significant progress, with state-of-the-art equipment and research areas being developed.
The ultimate goal of this research is to improve the performance and reliability of electronic devices by better understanding and controlling the effects of atomic-scale defects. This knowledge will be essential for the development of next-generation quantum computing and other advanced technologies.
Source: https://www.nist.gov/programs-projects/magnetic-resonance-spectroscopy
Keywords: quantum, metrology, spectroscopy, devices, defects
