The Nanoscale Device Characterization Division (NDCD) at NIST is developing advanced measurement techniques and standards for characterizing nano- and atom-scale devices. Their work focuses on:
1. World-class electrical and optical microscopy to study quantum behavior in nanoengineered materials
2. Advanced microelectronics measurements to ensure reliability of heterogeneous integrated systems
3. Measurement solutions for alternative computing architectures like neuromorphic computing
4. Atom-scale device development for quantum information processing and quantum standards
The NDCD is actively engaged in international standards development, ensuring rigorous measurement methodologies and data reporting for consensus-based standards creation. Their work is critical for advancing quantum technologies and ensuring reliable performance of future quantum devices and systems.
Source: https://www.nist.gov/pml/nanoscale-device-characterization-division
Keywords: Solid-state, Quantum behavior, Nanoengineering, Measurement science
