NIST has developed a new type of atomic force microscopy (AFM) probe that combines photonic and mechanical elements to improve measurement sensitivity and speed. The probe features a cantilever with an integrated optical resonator at its end, allowing for precise measurement of nanoscale motion while maintaining compatibility with existing optical interrogation systems.
The key innovation is the placement of the optical cavity at the end of a cantilever, which simplifies manufacturing compared to previous designs. This allows for batch microfabrication using standard techniques, making the probes more economically viable for commercialization.
The technology has potential applications across various fields, including nanotechnology, manufacturing, materials science, and mechanical engineering. By enabling faster, more sensitive measurements, these probes could advance research and development in these areas.
Source: https://www.nist.gov/patents/photonic-probe-atomic-force-microscopy
Keywords: optical, cavity, photonic
