NIST researchers are developing a revolutionary quantum-accurate, chip-scale device that could revolutionize dimensional measurements. This compact device, which fits on a silicon chip, uses the same principles as current industry standards but operates at a fraction of the cost and size.
The device relies on precise measurements of atomic transitions using tunable lasers and optical fibers. It could achieve measurement uncertainties in the parts per trillion range, making it far more accurate than current commercial standards while being highly manufacturable.
This technology has the potential to dramatically increase the range of applications for precise length measurements, from industrial calibration to high-density optical fiber communication systems. The development is an ongoing research effort with several publications and patents related to the technology.
Source: https://www.nist.gov/noac/technology/dimensional-metrology
Keywords: Metrology, Wavelength, Standard, Accuracy
