2016 Joseph F. Keithley Award – Samuel Benz | NIST

Title: Samuel Benz Receives 2016 Joseph F. Keithley Award for Quantum-Based Superconducting Voltage Standards

Summary:
Samuel Benz, a researcher at NIST’s Optoelectronics and Photonics Division, has been awarded the prestigious 2016 Joseph F. Keithley Award by the IEEE for his groundbreaking work in quantum-based superconducting voltage standards. These standards are crucial for ensuring the accuracy and reliability of electrical measurements across various industries and applications.

The IEEE Awards Program recognizes technical professionals whose exceptional achievements and contributions have made a lasting impact on technology, society, and the engineering profession. Benz’s work on creating and disseminating quantum-based superconducting voltage standards has set a new benchmark in the field of electrical measurements, paving the way for more precise and reliable standards in the future.

Source: https://www.nist.gov/awards/2016-joseph-f-keithley-award-samuel-benz

Keywords: superconducting, voltage, measurements, standards, instrumentation

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