Title: NIST Develops Advanced Tools for Nanoscale Thermal Property Measurement
The National Institute of Standards and Technology (NIST) is working on innovative tools to precisely measure thermal properties at the nanoscale. These advancements are crucial for the U.S. semiconductor industry, as they will enable more accurate characterization of new materials and interfaces in heterogeneously integrated devices.
Current challenges in thermal metrology have been identified, such as the inadequacy of existing techniques to measure properties at the nanoscale. By developing two new measurement tools, this NIST project aims to satisfy unmet needs within the semiconductor ecosystem, including validating modeling and facilitating the co-design and integration of advanced packaging solutions.
The potential impacts of these advancements include:
1. Providing reliable data for simulations of devices and chiplets, reducing development cycles for advanced semiconductor devices.
2. Potential commercialization of an ultrahigh throughput, super resolution microscope, aiding both development and quality control for U.S. semiconductor infrastructure.
The project focuses on overcoming current limitations in nanoscale thermal property measurement, with the goal of revolutionizing thermal metrology and supporting the advancement of the U.S. semiconductor industry.
Source: https://www.nist.gov/programs-projects/accurate-mapping-thermal-properties-nanoscale
Keywords: thermal properties, nanoscale, semiconductor industry
