NIST Researchers Develop Advanced Nanomagnet Measurement Techniques
The National Institute of Standards and Technology (NIST) is advancing the development of next-generation electronics through groundbreaking research on nanomagnet dynamics. The NIST Center for Nanoscale Science and Technology (CNST) is focusing on two key measurement techniques:
1. Ferromagnetic resonance force microscopy: This innovative approach allows researchers to probe, manipulate, and image the dynamic behavior of individual nanostructures. By detecting magnetic precession through small changes in force between the sample and a magnetic tip on a scanned probe, this technique enables precise measurement of magnetic properties at the nanoscale.
2. Spin torque effects: The project investigates how electron spins carried by electric currents affect nanomagnets. Understanding these effects is crucial for improving the uniformity and reliability of future electronics based on magnetic nanodevices.
In addition to these techniques, NIST researchers are exploring the use of nitrogen-vacancy defects in diamond for improved resolution and sensitivity in magnetic resonance microscopy. They are also working on harnessing fiber-optic telecommunications technology for non-contact measurements of magnetization dynamics, which could offer benefits in terms of easy access to measurements and freedom from frequency limitations.
The results of this research support the development of technologies such as computer hard drives, magnetic memory chips, magnetic logic, and second-generation spin-torque memory chips. By understanding and controlling the dynamics of nanomagnets, NIST aims to improve the performance and reliability of future electronics.
Source: https://www.nist.gov/programs-projects/nanomagnet-dynamics
Keywords: Nanomagnet, Magnetic resonance microscopy, Spin torque
