NIST’s Waveform Metrology Project aims to establish measurement standards for waveforms in optics and high-frequency electronics. The project focuses on electro-optic sampling techniques to measure photodiode vector response and provide phase traceability for various instruments. Key research areas include extending traceability beyond 100 GHz, employing asynchronous optical sampling, and developing pulse sources up to 1 THz. The project also involves comparing different instruments for modulated-signal measurements and exploring ways to interface with various measurement domains while maintaining traceability and uncertainty analysis. The ultimate goal is to provide full waveform metrology with traceability to the International System of Units, considering both temporal and frequency domain representations of waveforms.
Source: https://www.nist.gov/programs-projects/waveform-metrology-project
Keywords: Waveform metrology, NIST, Electro-optic sampling (EOS)
