The CHIPS for America program has released a beta version of the Metrology Exchange to Innovate in Semiconductors (METIS) data ecosystem. METIS will provide stakeholders with access to research results from CHIPS Metrology projects, aiming to catalyze innovative breakthroughs in U.S. semiconductor manufacturing.
The beta version includes initial data from three CHIPS Metrology projects, aligned with seven grand challenges that require critical attention from a metrology perspective. To date, CHIPS for America has funded over $190 million across more than 40 projects to develop new measurement instruments, methods, and models for advanced microelectronics design and manufacturing.
Once fully deployed, METIS will make available research and data from all CHIPS Metrology projects. The program aims to enhance U.S. security and commercial competitiveness in the semiconductor industry through data sharing and exchange.
Keywords: Metrology, Microelectronics, Measurement, Instrumentation, Simulation
