This article discusses research conducted at NIST using an Electron Beam Ion Trap (EBIT) to study highly charged ions. The EBIT allows for precise control and observation of ions in various charge states, enabling detailed spectroscopic measurements.
Key findings include:
– Successful extension of EBIT spectroscopy into visible and UV ranges
– Observation of forbidden M1 transitions in titanium-like barium and xenon
– Development of new reflective and refractive optics for high efficiency and resolution
– Measurement of wavelength accuracy sufficient to reveal discrepancies with theoretical calculations
– Study of electron impact ionization, radiative recombination, and dielectronic recombination processes
– Use of computer simulations to model ion behavior and optimize EBIT parameters
– Measurement of excited-state lifetimes and their importance for plasma diagnostics
– Development of ion extraction system for studying interactions between highly charged ions and surfaces
The research has implications for understanding atomic structure, plasma physics, and ion-surface interactions, with potential applications in fusion energy, semiconductor manufacturing, and materials science.
Keywords: ionization, recombination, quantum, sensing, metrology, lifetimes, spectroscopy, ion, charge
