Pragya R. Shrestha is an electrical engineer at the National Institute of Standards and Technology (NIST) in the United States. Her research focuses on characterizing electronic devices at extremely low temperatures and measuring their performance over very short time periods.
Shrestha has developed innovative techniques for studying the electrical properties of new types of electronic devices. She has also created a highly sensitive method for measuring electron spin resonance, which can be used to study a wide variety of materials.
Her current work aims to better understand how electronic devices behave and how reliable they are when operated at very low temperatures, which is important for developing new quantum computing technologies.
Source: https://www.nist.gov/people/pragya-shrestha
Keywords: ESR, Cryogenic, Device Characterization
