NIST has developed a new sensor that could significantly improve the accuracy of atomic force microscopes (AFMs), one of the most important tools in nanotechnology research. The sensor, which is built into the AFM’s cantilever, allows for precise calibration of the tip’s sensitivity without needing to remove it from the microscope. This eliminates the need for separate calibration equipment and makes the process more accurate and convenient.
The new sensor is made of a silicate material similar to quartz and uses an interferometer to measure the cantilever’s vibrations. It can detect forces as small as femtonewtons, which is 1,000 times less than the force needed to stretch a single DNA molecule. This self-calibrating sensor is part of a new class of portable, embedded standards developed by NIST that can be used in tight spaces like the AFM.
The potential impact of this development is significant, as it could make nanoscale measurements more accurate and accessible to researchers worldwide. This could lead to advances in various fields, including materials science, electronics, and medicine, where precise measurements at the nanoscale are crucial.
Keywords: Calibration, Atomic, Interferometer
