NIST has developed a new method to reduce uncertainty in X-ray wavelength measurements, marking the first major advance since the 1970s. The new approach uses laser beams bouncing off a mirrored polygon to measure angles with unprecedented precision, achieving an accuracy of 0.06 arcseconds – three times better than previous methods.
This improvement is significant for various fields that rely on precise X-ray measurements, including law enforcement, astrophysics, and materials science. The enhanced accuracy will allow for better understanding of novel materials and their properties, which could lead to breakthroughs in high-temperature superconductivity and other advanced technologies.
Source: https://www.nist.gov/news-events/news/2015/03/nist-gets-new-angle-x-ray-measurements
Keywords: X-ray, Angle, Wavelength, Precision, Metrology
