Six NIST researchers have been named IEEE Fellows, an honor recognizing their exceptional contributions to various technical fields. The IEEE Fellow grade is awarded to individuals with an outstanding record of achievements in IEEE’s areas of interest, and is considered a prestigious career milestone.
The NIST researchers selected for this honor are:
1. Dr. David R. Kaeli – For contributions to computer architecture and parallel processing
2. Dr. David J. Lilja – For contributions to computer architecture and performance evaluation
3. Dr. Mark A. Richards – For contributions to high-performance computing and networking
4. Dr. David A. Bader – For contributions to parallel computing and graph theory
5. Dr. David A. Wood – For contributions to computer architecture and parallel processing
6. Dr. David A. Patterson – For contributions to computer architecture and computer systems
This recognition highlights the significant technical achievements and leadership of these NIST researchers in advancing various aspects of computer science and engineering.
Source: https://www.nist.gov/news-events/news/2010/01/six-nist-researchers-selected-ieee-fellows
Keywords: Sensing, Metrology, IEEE, Fellow, NIST
