Researchers at NIST have developed a new microscopy technique that combines the strengths of optical and electron microscopy. The technique uses specially engineered quantum dots to absorb electron beam energy and emit visible light, allowing for high-resolution imaging of surface and subsurface features down to 10 nanometers.
The new method has several advantages over conventional microscopy techniques. It can achieve higher resolutions without being limited by the diffraction limit, and it doesn’t require the high energies or sample preparation needed for electron microscopy. This makes it suitable for imaging fragile specimens like tissue.
The technique was developed through a collaboration between NIST researchers and companies specializing in quantum dot technology. The researchers are excited about the potential applications of this technique in various research fields and are working to make it available to the wider research community.
Keywords: Quantum, Microscopy, Nanometer-scale, Electron, Resolution
