Dr. Martin Sohn, a physicist at NIST, is leading two major research projects focused on advanced microscopy and quantum imaging. The Nanoscale Fourier Ptychographic Microscopy Project aims to develop new techniques for 3D imaging and characterization of semiconductor devices at the nanoscale level using deep ultraviolet and extreme ultraviolet light sources. This project will enable precise measurement of nanoscale dimensions and detection of defects in semiconductor devices.
The Quantum Imaging Project, also led by Dr. Sohn, focuses on understanding quantum phenomena through multi-dimensional imaging of quantum states using single photons. This project explores various quantum and classical imaging techniques, including nanosecond-gated single photon imaging, single photon interference, and quantum harmonic oscillation in trapped micro/nano particles. Researchers interested in joining these projects can contact Dr. Sohn at martin.sohn@nist.gov or explore research opportunities through the NRC Research Associate Programs.
Source: https://www.nist.gov/people/martin-sohn
Keywords: EUV, Ptychography, Nanoscale, Imaging
