NIST researchers have revived and improved a technique called charge pumping to detect defects in transistors, which are crucial components in modern electronic devices. The new method, called frequency-modulated charge pumping, can detect single defects as small as the diameter of a hydrogen atom and is sensitive enough for the most advanced transistor technologies.
The technique works by applying positive and negative voltages at two different frequencies, allowing researchers to subtract out the confounding quantum tunneling current. This enables accurate detection of defects that could impair transistor performance. The method may also have applications in quantum metrology and exploring how electron spin could store and transfer information in future quantum computers.
Keywords: electrons, current, charge, quantum, defects
