NIST is organizing a workshop focused on developing metrology test vehicles for advanced electronic systems. The workshop will bring together experts in circuit design, device engineering, and nanofabrication to create open-source designs for testing monolithically integrated electronic devices.
Key points:
– The workshop will discuss parametric test structures and system prototypes for various applications
– A working group will develop non-proprietary, open-source test vehicles for monolithic integration with CMOS
– Designs will be manufactured in the SKY130 process node and made available through a public-private partnership
– The goal is to enable research into advanced semiconductor manufacturing and metrology
The workshop aims to create a standardized set of test vehicles that can be used by researchers and manufacturers to validate and optimize the performance of complex electronic systems, particularly those incorporating emerging technologies like neuromorphic computing, superconducting devices, and photonic integration.
Source: https://www.nist.gov/news-events/events/2022/09/nist-integrated-circuits-metrology-workshop
Keywords: Metrology, Parametric test structures, Monolithically integrated electronic devices
