This article discusses NIST’s work on developing new measurement techniques and standards for studying the mechanical behavior of materials at the nanoscale. These methods are crucial for understanding how materials behave during manufacturing, use, and failure, especially in nanostructured materials and devices. NIST has introduced advanced X-ray imaging techniques, such as ultra-small-angle X-ray scattering (USAXS) imaging, which allow researchers to study elastic strains, defects, and crystal structures within tiny sample volumes. These tools are now available at the Advanced Photon Source (APS) and have been used in experiments on materials like nanowires and artificial rubber.
NIST is also working on creating an intrinsic force standard using the deformation of gold nanowires. Quantum-level simulations show that the breaking force of gold nanowires is highly consistent, making them a promising candidate for a standard to measure very small forces. Additionally, NIST is improving nanoindentation methods by evaluating how variations in probe shape and sample roughness affect measurements. These efforts aim to make nanoscale measurements more accurate and reliable, supporting advancements in materials science and engineering.
Source: https://www.nist.gov/programs-projects/fundamentals-deformation
Keywords: nanoscale measurement, X-ray imaging, nanoindentation
