Cryptography | NIST
NIST has been a leader in cryptography for 50 years, developing standards and guidelines that enable secure data exchange. Their work has…
EUV Scatterometry | NIST
The article discusses the development of advanced scatterometry techniques for measuring and inspecting the smallest features on integrated…
Dynamic EUV Metrology of Nanoscopic Thermal Transport in Active Devices | NIST
Title: NIST Develops Advanced EUV Metrology for Nanoscale Thermal Transport Measurement The National Institute of Standards and Technology…
Strain Measurement for Semiconductor Devices and Packages | NIST
Title: NIST Advances Strain Measurement Techniques for Semiconductor Devices The National Institute of Standards and Technology (NIST) has…
RF Metrology for High-Frequency Transistor Models | NIST
NIST is working on a project to improve high-frequency transistor modeling and characterization for US semiconductor companies. The project…
Electron-Solid Interactions | NIST
The article discusses the importance of understanding electron-solid interactions for accurate interpretation of scanning electron microscopy…
Non-Destructive Semiconductor Structure Function and Process Optimization for future Microelectronics Manufacturing at the NIST NSLS-II Beamline for XAFS and Diffraction | NIST
NIST is enhancing its synchrotron beamline for advanced semiconductor material characterization. The upgrades will improve X-ray diffraction…
Metrology of Materials, Surfaces, and Processes for Hybrid Advanced Packaging | NIST
The article discusses NIST’s research into metrology for advanced hybrid packaging bonding processes. The project aims to develop…
Optical Networking of Superconducting Quantum Computers with Transduction Devices | NIST
NIST researchers are developing a quantum internet protocol for superconducting quantum computers, aiming to create the world’s first…