FCMN, Publications and Talks | NIST
The FCMN conference series focuses on the latest advancements in semiconductor characterization and metrology. The conference brings together…
Quantum Simulation and Sensing with Trapped Ions | NIST
Researchers at NIST have developed a new method for quantum simulation and sensing using trapped ions. They created two-dimensional arrays of…
Communication Linker for Communication Linking | NIST
The article discusses a new communication linker technology developed by the United States, which includes a classical encoder, optical…
Apparatus for Critical-Dimension Localization Microscopy | NIST
NIST has developed a new method called Critical-Dimension Localization Microscopy (CDLM) that establishes SI-traceability for optical…
Ambient Temperature Superionic Conducting Salt Including Metal Cation and Borate Anion or Carborate Anion and Process for Making Ambient Temperature Superionic Conducting Salt | NIST
NIST has developed a novel class of superionic conductor materials that could revolutionize all-solid-state batteries. These materials combine…
2023 AAAS Fellow – Angela Hight Walker | NIST
Dr. Angela Hight Walker, a distinguished senior scientist at NIST, has been elected as a 2023 AAAS Fellow for her pioneering work in optical…
State Calibration Scope | NIST
Title: NIST Releases State Calibration Scope Summary Document NIST has published a new document titled “State Calibration Scope…
Photonic Dosimetry | NIST
NIST is developing a new type of chip-based sensor for measuring ionizing radiation doses at very small scales, as part of its NIST on a Chip…
Machine Learning Driven Self-correcting Autonomous Metrology Systems (SAMS) | NIST
NIST is developing machine learning-driven autonomous metrology systems as part of their NIST-on-a-Chip program. These systems aim to remove…